Vol. 2011, Issue 1, 2011January 01, 2011 EDT
Bulk and In-Circuit Dielectric Characterization of LTCC Tape Systems Through Millimeter Wave Frequency Range
Bulk and In-Circuit Dielectric Characterization of LTCC Tape Systems Through Millimeter Wave Frequency Range
Thrasher, Bradley, Deepukumar Nair, James Parisi, Glenn Oliver, and Michael A. Smith. 2011. “Bulk and In-Circuit Dielectric Characterization of LTCC Tape Systems Through Millimeter Wave Frequency Range.” IMAPSource Proceedings 2011 (1): 740–46. https://doi.org/10.4071/isom-2011-WP3-Paper2.