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Symposium Proceedings
Vol. 2016, Issue 1, 2016
October 01, 2016 EDT
Reliability of SAC 105 and SAC1205N under Drop Tests
Jia-Shen Lan
,
Stuwart Fan
,
Louie Huang
,
Mei-Ling Wu
,
TFBGA Package
Fatigue Life
Drop test
Simulation
SAC105
and SAC1205N
•
https://doi.org/10.4071/isom-2016-TP52
IMAPSource Conference Papers
Lan, Jia-Shen, Stuwart Fan, Louie Huang, and Mei-Ling Wu. 2016. “Reliability of SAC 105 and SAC1205N under Drop Tests.”
IMAPSource Proceedings
2016 (1): 106–10.
https://doi.org/10.4071/isom-2016-TP52
.
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