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Symposium Proceedings
Vol. 2016, Issue 1, 2016October 01, 2016 EDT

Reliability of SAC 105 and SAC1205N under Drop Tests

Jia-Shen Lan, Stuwart Fan, Louie Huang, Mei-Ling Wu,
TFBGA PackageFatigue LifeDrop testSimulationSAC105and SAC1205N
https://doi.org/10.4071/isom-2016-TP52
IMAPSource Conference Papers
Lan, Jia-Shen, Stuwart Fan, Louie Huang, and Mei-Ling Wu. 2016. “Reliability of SAC 105 and SAC1205N under Drop Tests.” IMAPSource Proceedings 2016 (1): 106–10. https:/​/​doi.org/​10.4071/​isom-2016-TP52.
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