Vol. 2011, Issue 1, 2011January 01, 2011 EDT
MEMS Integrated Packaging for RF Circuit Testing and Self Calibration
MEMS Integrated Packaging for RF Circuit Testing and Self Calibration
Kannan, Sukeshwar, Bruce Kim, Naga Sai Evana, Anurag Gupta, and Seok-Ho Noh. 2011. “MEMS Integrated Packaging for RF Circuit Testing and Self Calibration.” IMAPSource Proceedings 2011 (1): 635–40. https://doi.org/10.4071/isom-2011-WA5-Paper5.
Powered by Scholastica, the modern academic journal management system