A Study of Defects in High Reliability Die Sort Applications | Published in IMAPSource Proceedings

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IMAPSource Conference Papers

Parrish, Sarah. 2019. “A Study of Defects in High Reliability Die Sort Applications.” IMAPSource Proceedings 2019 (1): 463–69. https://doi.org/10.4071/2380-4505-2019.1.000463.

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