Metallic TIM Testing and Selection for IC, Power, and RF Semiconductors

Tim Jensen; David L. Saums

doi:10.4071/isom-2016-THA46

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Jensen, Tim, and David L. Saums. 2016. “Metallic TIM Testing and Selection for IC, Power, and RF Semiconductors.” IMAPSource Proceedings 2016 (1): 490–97. https://doi.org/10.4071/isom-2016-THA46.

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