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Symposium Proceedings
Vol. 2016, Issue 1, 2016October 01, 2016 EDT

Pre-applied inter chip fill material for 3D chip stack integration – How to improve bonding quality and reliability

Kan Takeshita, Makoto Ikemoto, Masaya Sugiyama, Hidehiro Yamamoto, Hideki Kiritani, Jun-Wei Shen, Tetsuharu Yuge, Hiroya Kodama, Yasuhiro Kawase,
3D-IC Pre-applied underfill Reliability test Mechanical property and stress analysis
• https://doi.org/10.4071/isom-2016-WP43
IMAPSource Conference Papers
Takeshita, Kan, Makoto Ikemoto, Masaya Sugiyama, Hidehiro Yamamoto, Hideki Kiritani, Jun-Wei Shen, Tetsuharu Yuge, Hiroya Kodama, and Yasuhiro Kawase. 2016. “Pre-Applied Inter Chip Fill Material for 3D Chip Stack Integration – How to Improve Bonding Quality and Reliability.” IMAPSource Proceedings 2016 (1): 333–37. https://doi.org/10.4071/isom-2016-WP43.
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