This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Skip to main content
null
IMAPSource Conference Papers
  • Menu
  • Articles
    • Ceramics Conference Papers
    • Device Packaging Conference Presentations
    • EMPC Conference Proceedings (IMAPS Europe)
    • General
    • High Temperature Conference Papers
    • IMAPS Chapter Conferences
    • Symposium Proceedings
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • Journal Micro & Elect Pkg
  • search
  • LinkedIn (opens in a new tab)
  • RSS feed (opens a modal with a link to feed)

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:59820/feed
ISSN 2380-4505
Symposium Proceedings
Vol. 2016, Issue 1, 2016October 01, 2016 EDT

Pre-applied inter chip fill material for 3D chip stack integration – How to improve bonding quality and reliability

Kan Takeshita, Makoto Ikemoto, Masaya Sugiyama, Hidehiro Yamamoto, Hideki Kiritani, Jun-Wei Shen, Tetsuharu Yuge, Hiroya Kodama, Yasuhiro Kawase,
3D-ICPre-applied underfillReliability testMechanical property and stress analysis
https://doi.org/10.4071/isom-2016-WP43
IMAPSource Conference Papers
Takeshita, Kan, Makoto Ikemoto, Masaya Sugiyama, Hidehiro Yamamoto, Hideki Kiritani, Jun-Wei Shen, Tetsuharu Yuge, Hiroya Kodama, and Yasuhiro Kawase. 2016. “Pre-Applied Inter Chip Fill Material for 3D Chip Stack Integration – How to Improve Bonding Quality and Reliability.” IMAPSource Proceedings 2016 (1): 333–37. https:/​/​doi.org/​10.4071/​isom-2016-WP43.

View more stats

Powered by Scholastica, the modern academic journal management system