Vol. 2016, Issue 1, 2016October 01, 2016 EDT
Investigation of the Defect Size and Density in Thin SiON Filmfor Organic Device Encapsulation
Investigation of the Defect Size and Density in Thin SiON Filmfor Organic Device Encapsulation
Chu, Kunmo, Ki Deok Bae, Byong Gwon Song, Yong Young Park, Jaekwan Kim, Wenxu Xianyu, and Chang Seung Lee. 2016. “Investigation of the Defect Size and Density in Thin SiON Filmfor Organic Device Encapsulation.” IMAPSource Proceedings 2016 (1): 272–76. https://doi.org/10.4071/isom-2016-WP15.