Design, Fabrication, Electrical Characterization and Reliability of Nanomaterials Based Embedded Passives

Rabindra N. Das; John M. Lauffer; Steven G. Rosser; Mark D. Poliks; Voya R. Markovich

doi:10.4071/isom-2010-THA3-Paper4

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Das, Rabindra N., John M. Lauffer, Steven G. Rosser, Mark D. Poliks, and Voya R. Markovich. 2010. “Design, Fabrication, Electrical Characterization and Reliability of Nanomaterials Based Embedded Passives.” IMAPSource Proceedings 2010 (1): 847–54. https://doi.org/10.4071/isom-2010-THA3-Paper4.

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