Properties and Reliability of Silicon Nitride Substrates with AMB Copper Conductor

Böhm Gaby; Brunner Dieter; Sichert Ina; Pönicke Andreas; Schilm Jochen

doi:10.4071/isom-2011-WP4-Paper1

Loading [Contrib]/a11y/accessibility-menu.js

Gaby, Böhm, Brunner Dieter, Sichert Ina, Pönicke Andreas, and Schilm Jochen. 2011. “Properties and Reliability of Silicon Nitride Substrates with AMB Copper Conductor.” IMAPSource Proceedings 2011 (1): 777–84. https://doi.org/10.4071/isom-2011-WP4-Paper1.

View more stats