Vol. 2011, Issue 1, 2011January 01, 2011 EDT
Properties and Reliability of Silicon Nitride Substrates with AMB Copper Conductor
Properties and Reliability of Silicon Nitride Substrates with AMB Copper Conductor
Gaby, Böhm, Brunner Dieter, Sichert Ina, Pönicke Andreas, and Schilm Jochen. 2011. “Properties and Reliability of Silicon Nitride Substrates with AMB Copper Conductor.” IMAPSource Proceedings 2011 (1): 777–84. https://doi.org/10.4071/isom-2011-WP4-Paper1.