ISSN 2380-4505
Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Statistical Analysis Approach to Improve the High Speed Signal Quality by Including the Manufacturing Process Variations of Printed Circuit Board
Statistical Analysis Approach to Improve the High Speed Signal Quality by Including the Manufacturing Process Variations of Printed Circuit Board
Seungyong Baek, Mike Sapozhnikov, Warren Meggitt, Philip Pun, Jason Visneski, Ramesh Velugoti, Amit Agrawal,
Baek, Seungyong, Mike Sapozhnikov, Warren Meggitt, Philip Pun, Jason Visneski, Ramesh Velugoti, and Amit Agrawal. 2010. “Statistical Analysis Approach to Improve the High Speed Signal Quality by Including the Manufacturing Process Variations of Printed Circuit Board.” IMAPSource Proceedings 2010 (1): 428–33. https://doi.org/10.4071/isom-2010-WA2-Paper6.