Skip to main content
null
IMAPSource Conference Papers
  • Menu
  • Articles
    • Ceramics Conference Papers
    • Device Packaging Conference Presentations
    • EMPC Conference Proceedings (IMAPS Europe)
    • General
    • High Temperature Conference Papers
    • IMAPS Chapter Conferences
    • Symposium Proceedings
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • Journal Micro & Elect Pkg
  • search

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:3455/feed
Symposium Proceedings
Vol. 2020, Issue 1, 2020September 01, 2020 EDT

Methodology to Quantify Impact of Package Delamination on Performance of High-Side Smart Power Switch Design

Min Chu, Jie Chen, Abidur Rahman, Rajen Murugan,
Package delaminationpower switchesco-design modeling methodologyRDS(ON)current limiting
https://doi.org/10.4071/2380-4505-2020.1.000015
IMAPSource Conference Papers
Chu, Min, Jie Chen, Abidur Rahman, and Rajen Murugan. 2020. “Methodology to Quantify Impact of Package Delamination on Performance of High-Side Smart Power Switch Design.” IMAPSource Proceedings 2020 (1): 15–20. https:/​/​doi.org/​10.4071/​2380-4505-2020.1.000015.
Save article as...▾

View more stats

This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Powered by Scholastica, the modern academic journal management system