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Symposium Proceedings
Vol. 2016, Issue 1, 2016
October 01, 2016 EDT
PHOTOLITHOGRAPHY ALIGNMENT MARK TRANSFER SYSTEM FOR LOW COST ADVANCED PACKAGING AND BONDED WAFER APPLICATIONS
Keith Best
,
Steve Gardner
,
Casey Donaher
,
Advanced packaging
3D IC
TSV
backside alignment
stepper
panel
bonded wafer alignment
through silicon via
UBM alignment
latent image
•
https://doi.org/10.4071/isom-2016-WP34
IMAPSource Conference Papers
Best, Keith, Steve Gardner, and Casey Donaher. 2016. “PHOTOLITHOGRAPHY ALIGNMENT MARK TRANSFER SYSTEM FOR LOW COST ADVANCED PACKAGING AND BONDED WAFER APPLICATIONS.”
IMAPSource Proceedings
2016 (1): 315–20.
https://doi.org/10.4071/isom-2016-WP34
.
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