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ISSN 2380-4505
Symposium Proceedings
Vol. 2012, Issue 1, 2012January 01, 2012 EDT

Measurement-based Signal Quality Test of High-speed TSV Channel

Heegon Kim, Jonghyun Cho, Daniel H. Jung, Jonghoon J. Kim, Joungho Kim, Jun So Pak, Kwang-Seong Choi, Hyun-Cheol Bae,
High-speed TSV channelchannel losseye-diagramsilicon-conductanceoxide-capacitancereflection
https://doi.org/10.4071/isom-2012-TP22
IMAPSource Conference Papers
Kim, Heegon, Jonghyun Cho, Daniel H. Jung, Jonghoon J. Kim, Joungho Kim, Jun So Pak, Kwang-Seong Choi, and Hyun-Cheol Bae. 2012. “Measurement-Based Signal Quality Test of High-Speed TSV Channel.” IMAPSource Proceedings 2012 (1): 295–302. https:/​/​doi.org/​10.4071/​isom-2012-TP22.

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