Vol. 2016, Issue 1, 2016October 01, 2016 EDT
Electrical Characterization of Low-Profile Copper Foil for Reduced Surface Roughness Loss
Electrical Characterization of Low-Profile Copper Foil for Reduced Surface Roughness Loss
Su, Qianfei, A. Ege Engin, and Jerry Aguirre. 2016. “Electrical Characterization of Low-Profile Copper Foil for Reduced Surface Roughness Loss.” IMAPSource Proceedings 2016 (1): 358–63. https://doi.org/10.4071/isom-2016-WP52.
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