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Symposium Proceedings
Vol. 2016, Issue 1, 2016October 01, 2016 EDT

Electrical Characterization of Low-Profile Copper Foil for Reduced Surface Roughness Loss

Qianfei Su, A. Ege Engin, Jerry Aguirre,
Materials CharacterizationDielectric ConstantLoss TangentCavity ResonatorSurface RoughnessCross Section
https://doi.org/10.4071/isom-2016-WP52
IMAPSource Conference Papers
Su, Qianfei, A. Ege Engin, and Jerry Aguirre. 2016. “Electrical Characterization of Low-Profile Copper Foil for Reduced Surface Roughness Loss.” IMAPSource Proceedings 2016 (1): 358–63. https:/​/​doi.org/​10.4071/​isom-2016-WP52.
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