Vol. 2010, Issue 1, 2010January 01, 2010 EDT
Characterization of Black Pad Defect on Electroless Nickel- Immersion Gold (ENIG) Plated Circuits
Characterization of Black Pad Defect on Electroless Nickel- Immersion Gold (ENIG) Plated Circuits
Mortensen, Adam W., and Roger M. Devaney. 2010. “Characterization of Black Pad Defect on Electroless Nickel- Immersion Gold (ENIG) Plated Circuits.” IMAPSource Proceedings 2010 (1): 608–14. https://doi.org/10.4071/isom-2010-WP3-Paper1.