Characterization of Black Pad Defect on Electroless Nickel- Immersion Gold (ENIG) Plated Circuits

Adam W. Mortensen; Roger M. Devaney

doi:10.4071/isom-2010-WP3-Paper1

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Mortensen, Adam W., and Roger M. Devaney. 2010. “Characterization of Black Pad Defect on Electroless Nickel- Immersion Gold (ENIG) Plated Circuits.” IMAPSource Proceedings 2010 (1): 608–14. https://doi.org/10.4071/isom-2010-WP3-Paper1.

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