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ISSN 2380-4505
Symposium Proceedings
Vol. 2020, Issue 1, 2020September 01, 2020 EDT

The effect of Cu target pad roughness on the growth mode and void formation in electroless Cu films

Tobias Bernhard, Sebastian Zarwell, Edith Steinhäuser, Stefan Kempa, Frank Brüning,
blind micro viaelectroless Cunanovoidstacked via reliabilitytarget pad roughness
https://doi.org/10.4071/2380-4505-2020.1.000291
IMAPSource Conference Papers
Bernhard, Tobias, Sebastian Zarwell, Edith Steinhäuser, Stefan Kempa, and Frank Brüning. 2020. “The Effect of Cu Target Pad Roughness on the Growth Mode and Void Formation in Electroless Cu Films.” IMAPSource Proceedings 2020 (1): 291–97. https:/​/​doi.org/​10.4071/​2380-4505-2020.1.000291.

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