Ogawa, Ennis, Aimin Xing, David F.-S. Liao, Ten V. Y. Ten, Chong Wei Neo, Feynman W.-C. Chiang, Gaius See, et al. 2016. “Assessment of Optimized Process Quality and Reliability for Wafer Level Applications.”
IMAPSource Proceedings 2016 (S2): S1–52.
https://doi.org/10.4071/isom-2016-slide-6.