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Symposium Proceedings
Vol. 2016, Issue 1, 2016October 01, 2016 EDT

Effects of x-ray exposure on NOR and NAND flash memories during high-resolution 2D and 3D x-ray inspection

Anju Sharma, Preeth Sivakumar, Andrew Feigel, In Tae Bae, Lawrence P. Lehman, Joseph Gregor, James Cash, Joseph Kolly,
Flash memoriesx-ray inspectionradiation damagebit errorsdata corruption
https://doi.org/10.4071/isom-2016-THP53
IMAPSource Conference Papers
Sharma, Anju, Preeth Sivakumar, Andrew Feigel, In Tae Bae, Lawrence P. Lehman, Joseph Gregor, James Cash, and Joseph Kolly. 2016. “Effects of X-Ray Exposure on NOR and NAND Flash Memories during High-Resolution 2D and 3D x-Ray Inspection.” IMAPSource Proceedings 2016 (1): 660–65. https:/​/​doi.org/​10.4071/​isom-2016-THP53.
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