Effects of x-ray exposure on NOR and NAND flash memories during high-resolution 2D and 3D x-ray inspection

Anju Sharma; Preeth Sivakumar; Andrew Feigel; In Tae Bae; Lawrence P. Lehman; Joseph Gregor; James Cash; Joseph Kolly

doi:10.4071/isom-2016-THP53

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Sharma, Anju, Preeth Sivakumar, Andrew Feigel, In Tae Bae, Lawrence P. Lehman, Joseph Gregor, James Cash, and Joseph Kolly. 2016. “Effects of X-Ray Exposure on NOR and NAND Flash Memories during High-Resolution 2D and 3D x-Ray Inspection.” IMAPSource Proceedings 2016 (1): 660–65. https://doi.org/10.4071/isom-2016-THP53.

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