Effects of x-ray exposure on NOR and NAND flash memories during high-resolution 2D and 3D x-ray inspection

Sharma, Anju, Preeth Sivakumar, Andrew Feigel, In Tae Bae, Lawrence P. Lehman, Joseph Gregor, James Cash, and Joseph Kolly. 2016. “Effects of X-Ray Exposure on NOR and NAND Flash Memories during High-Resolution 2D and 3D x-Ray Inspection.” IMAPSource Proceedings 2016 (1): 660–65. https:/​/​doi.org/​10.4071/​isom-2016-THP53.