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Symposium Proceedings
Vol. 2010, Issue 1, 2010January 01, 2010 EDT

Impact of Mechanical Simulation Methodology on Electronic Package Reliability Assessment with Applications to 3D TSS Technology

Zhongping Bao, James Burrell,
electronic packagingmechanical simulationreliability assessmentTSSTSVwarpage
https://doi.org/10.4071/isom-2010-TP1-Paper2
IMAPSource Conference Papers
Bao, Zhongping, and James Burrell. 2010. “Impact of Mechanical Simulation Methodology on Electronic Package Reliability Assessment with Applications to 3D TSS Technology.” IMAPSource Proceedings 2010 (1): 170–75. https:/​/​doi.org/​10.4071/​isom-2010-TP1-Paper2.
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