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ISSN 2380-4505
Symposium Proceedings
Vol. 2014, Issue 1, 2014January 01, 2014 EDT

Effects on the Reliability of Lead-Free Solder Joints under Harsh Environment

Zhou Hai, Jiawei Zhang, Chaobo Shen, Cong Zhao, John L. Evans, Micheal. J. Bozack.,
Board finishesisothermal aginglead-freemicrostructurereliabilitySnAgCu
https://doi.org/10.4071/isom-WA41
IMAPSource Conference Papers
Hai, Zhou, Jiawei Zhang, Chaobo Shen, Cong Zhao, John L. Evans, and Micheal. J. Bozack. 2014. “Effects on the Reliability of Lead-Free Solder Joints under Harsh Environment.” IMAPSource Proceedings 2014 (1): 471–76. https:/​/​doi.org/​10.4071/​isom-WA41.

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