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Symposium Proceedings
Vol. 2019, Issue 1, 2019October 01, 2019 EDT

A Study on Reduced/Absent Adhesion/Cap Layers for Optimized BEOL RC Performance

Dewei Xu, Zhiguo Sun, Haojun Zhang, Scott Pozder, Patrick Justison, Seung-Yeop Kook, Rod Augur, Robert Fox,
Adhesion layersgradient layersinterfacial adhesion strengthporous carbon doped oxides (p-SiCOH)SiCN capadvanced dielectric cap
https://doi.org/10.4071/2380-4505-2019.1.000591
IMAPSource Conference Papers
Xu, Dewei, Zhiguo Sun, Haojun Zhang, Scott Pozder, Patrick Justison, Seung-Yeop Kook, Rod Augur, and Robert Fox. 2019. “A Study on Reduced/Absent Adhesion/Cap Layers for Optimized BEOL RC Performance.” IMAPSource Proceedings 2019 (1): 591–94. https:/​/​doi.org/​10.4071/​2380-4505-2019.1.000591.
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