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Symposium Proceedings
Vol. 2019, Issue 1, 2019October 01, 2019 EDT

Cu pillar bump development for 7nm Chip package interaction (CPI) technology

Lei Fu, Milind Bhagavat, Cheryl Selvanayagam, Ken Leong, Ivor Barber,
7nmChip package interaction (CPI)Cu pillar bumpELKFEAqualificationreliabilitysimulation
https://doi.org/10.4071/2380-4505-2019.1.000176
IMAPSource Conference Papers
Fu, Lei, Milind Bhagavat, Cheryl Selvanayagam, Ken Leong, and Ivor Barber. 2019. “Cu Pillar Bump Development for 7nm Chip Package Interaction (CPI) Technology.” IMAPSource Proceedings 2019 (1): 176–82. https:/​/​doi.org/​10.4071/​2380-4505-2019.1.000176.
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