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Symposium Proceedings
Vol. 2019, Issue 1, 2019
October 01, 2019 EDT
Cu pillar bump development for 7nm Chip package interaction (CPI) technology
Lei Fu
,
Milind Bhagavat
,
Cheryl Selvanayagam
,
Ken Leong
,
Ivor Barber
,
7nm
Chip package interaction (CPI)
Cu pillar bump
ELK
FEA
qualification
reliability
simulation
•
https://doi.org/10.4071/2380-4505-2019.1.000176
IMAPSource Conference Papers
Fu, Lei, Milind Bhagavat, Cheryl Selvanayagam, Ken Leong, and Ivor Barber. 2019. “Cu Pillar Bump Development for 7nm Chip Package Interaction (CPI) Technology.”
IMAPSource Proceedings
2019 (1): 176–82.
https://doi.org/10.4071/2380-4505-2019.1.000176
.
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