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Symposium Proceedings
Vol. 2013, Issue 1, 2013
January 01, 2013 EDT
Advanced warpage characterization for FOWLP
Jorge Teixeira
,
Mário Ribeiro
,
Nélson Pinho
,
Wafer characterization
FOWLP
wafer shape
wafer ratio
warpage
•
https://doi.org/10.4071/isom-2013-WP21
IMAPSource Conference Papers
Teixeira, Jorge, Mário Ribeiro, and Nélson Pinho. 2013. “Advanced Warpage Characterization for FOWLP.”
IMAPSource Proceedings
2013 (1): 641–46.
https://doi.org/10.4071/isom-2013-WP21
.
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