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Symposium Proceedings
Vol. 2013, Issue 1, 2013
January 01, 2013 EDT
Improving WLCSP Reliability Through Solder Joint Geometry Optimization
Boyd Rogers
,
Chris Scanlan
,
Board level reliability
drop testing
thermal cycling
wafer-level bumping
wafer-level chip-scale packaging
•
https://doi.org/10.4071/isom-2013-WA45
IMAPSource Conference Papers
Rogers, Boyd, and Chris Scanlan. 2013. “Improving WLCSP Reliability Through Solder Joint Geometry Optimization.”
IMAPSource Proceedings
2013 (1): 546–50.
https://doi.org/10.4071/isom-2013-WA45
.
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