Vol. 2013, Issue 1, 2013January 01, 2013 EDT
Modeling and Reliability Analysis of TSVs for High Frequency Applications
Modeling and Reliability Analysis of TSVs for High Frequency Applications
Kannan, Kaushal, Bruce Kim, Sukeshwar Kannan, and Seok-Ho Noh. 2013. “Modeling and Reliability Analysis of TSVs for High Frequency Applications.” IMAPSource Proceedings 2013 (1): 245–49. https://doi.org/10.4071/isom-2013-TP23.