Vol. 2013, Issue 1, 2013January 01, 2013 EDT
Moisture Reliability Improvement of a High Performance Depletion Mode 0.15 um Gate PHEMT Process
Moisture Reliability Improvement of a High Performance Depletion Mode 0.15 um Gate PHEMT Process
Abrokwah, Jon, John Stanback, Jerry Wang, Molly Johnson, and Chi L. Jiaa. 2013. “Moisture Reliability Improvement of a High Performance Depletion Mode 0.15 Um Gate PHEMT Process.” IMAPSource Proceedings 2013 (1): 50–54. https://doi.org/10.4071/isom-2013-TA24.