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Symposium Proceedings
Vol. 2013, Issue 1, 2013January 01, 2013 EDT

Flip-chip Packages with Periphery Cu Pillar Bumps as Wire Bond Replacement—Design, Modeling & Characterization

Zhe Li, Siow Chek Tan, Yee Huan Yew, Pheak Ti Teh, MJ Lee, John Xie,
Copper pillarBond-On-Trace (BOT)Small form factorSignal Integrity (SI)Power Integrity (PI)Co-Design
https://doi.org/10.4071/isom-2013-TP21
IMAPSource Conference Papers
Li, Zhe, Siow Chek Tan, Yee Huan Yew, Pheak Ti Teh, MJ Lee, and John Xie. 2013. “Flip-Chip Packages with Periphery Cu Pillar Bumps as Wire Bond Replacement—Design, Modeling & Characterization.” IMAPSource Proceedings 2013 (1): 235–235. https:/​/​doi.org/​10.4071/​isom-2013-TP21.
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