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ISSN 2380-4505
Symposium Proceedings
Vol. 2013, Issue 1, 2013January 01, 2013 EDT

Cu Heavy Wirebonding for High Power Device Interconnection

Baik-Woo Lee, Chang-Sik Kim, Changmo Jeong, Younghun Byun, Jeong-Won Yoon, Che-Heung Kim, Seong Woon Booh, U-in Chung,
Cu heavy wirediodeIGBT (Insulated Gate Bipolar Transistors)power modulewirebonding
https://doi.org/10.4071/isom-2013-TP43
IMAPSource Conference Papers
Lee, Baik-Woo, Chang-Sik Kim, Changmo Jeong, Younghun Byun, Jeong-Won Yoon, Che-Heung Kim, Seong Woon Booh, and U-in Chung. 2013. “Cu Heavy Wirebonding for High Power Device Interconnection.” IMAPSource Proceedings 2013 (1): 318–23. https:/​/​doi.org/​10.4071/​isom-2013-TP43.

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