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Symposium Proceedings
Vol. 2017, Issue 1, 2017October 01, 2017 EDT

14nm Chip Package Interaction (CPI) Technology Development

Lei Fu, YS Low, Milind Bhagavat, Ivor Barber,
Chip package interaction (CPI) ELK Bumping reliability Back end of line (BEOL) crackstop Test chip
• https://doi.org/10.4071/isom-2017-WP12_054
IMAPSource Conference Papers
Fu, Lei, YS Low, Milind Bhagavat, and Ivor Barber. 2017. “14nm Chip Package Interaction (CPI) Technology Development.” IMAPSource Proceedings 2017 (1): 331–35. https://doi.org/10.4071/isom-2017-WP12_054.
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