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Symposium Proceedings
Vol. 2017, Issue 1, 2017
October 01, 2017 EDT
14nm Chip Package Interaction (CPI) Technology Development
Lei Fu
,
YS Low
,
Milind Bhagavat
,
Ivor Barber
,
Chip package interaction (CPI)
ELK
Bumping
reliability
Back end of line (BEOL)
crackstop
Test chip
•
https://doi.org/10.4071/isom-2017-WP12_054
IMAPSource Conference Papers
Fu, Lei, YS Low, Milind Bhagavat, and Ivor Barber. 2017. “14nm Chip Package Interaction (CPI) Technology Development.”
IMAPSource Proceedings
2017 (1): 331–35.
https://doi.org/10.4071/isom-2017-WP12_054
.
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