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ISSN 2380-4505
Symposium Proceedings
Vol. 2017, Issue 1, 2017October 01, 2017 EDT

High Reliability and High Throughput Ball Bumping Process Solution – Solder Joint Encapsulant Adhesives

Mary Liu, Wusheng Yin,
High ReliabilityHigh ThroughputBall BumpingSolder JointEncapsulantAdhesives
https://doi.org/10.4071/isom-2017-TP11_031
IMAPSource Conference Papers
Liu, Mary, and Wusheng Yin. 2017. “High Reliability and High Throughput Ball Bumping Process Solution – Solder Joint Encapsulant Adhesives.” IMAPSource Proceedings 2017 (1): 1–7. https:/​/​doi.org/​10.4071/​isom-2017-TP11_031.

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