Vol. 2017, Issue 1, 2017October 01, 2017 EDT
Automotive IC probing challenges –FFI MEMS Technology meets and exceeds expectation
Automotive IC probing challenges –FFI MEMS Technology meets and exceeds expectation
Bhardwaj, Ashish, and Amy Leong. 2017. “Automotive IC Probing Challenges –FFI MEMS Technology Meets and Exceeds Expectation.” IMAPSource Proceedings 2017 (1): 482–90. https://doi.org/10.4071/isom-2017-THA11_120.