ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009June 22, 2026 EDT
Interconnection Design and Impact Life Prediction Subjected to Board Level Drop Test
Interconnection Design and Impact Life Prediction Subjected to Board Level Drop Test
Chou, Chan-Yen, Chao-Jen Huang, Tuan-Yu Hung, and Kuo-Ning Chiang. 2026. “Interconnection Design and Impact Life Prediction Subjected to Board Level Drop Test.” IMAPSource Proceedings 2009 (Symposium): 768–75. https://doi.org/10.4071/001c.163720.