ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009May 27, 2026 EDT
Use of the Skin Effect for Detection of Interconnect Degradation
Use of the Skin Effect for Detection of Interconnect Degradation
Azarian, Michael H., Daeil Kwon, and Michael Pecht. 2026. “Use of the Skin Effect for Detection of Interconnect Degradation.” IMAPSource Proceedings 2009 (Symposium): 532–36. https://doi.org/10.4071/001c.162587.