ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009May 27, 2026 EDT
Reliability Impact of Defects in Lead-Free BGA Solder Joints – A Systematic Study
Reliability Impact of Defects in Lead-Free BGA Solder Joints – A Systematic Study
Bansal, Anurag, Kuo-Chuan Liu, Jie Xue, and Dave Towne. 2026. “Reliability Impact of Defects in Lead-Free BGA Solder Joints – A Systematic Study.” IMAPSource Proceedings 2009 (Symposium): 516–23. https://doi.org/10.4071/001c.162585.
