ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009May 11, 2026 EDT
Microspring Characterization and Flip Chip Assembly Reliability
Microspring Characterization and Flip Chip Assembly Reliability
Cheng, B. J., E.M. Chow, D. DeBruyker, C. Chua, K. Sahasrabuddhe, I. Shubin, J. Cunningham, Y. Luo, and A. V. Krishnamoorthy. 2026. “Microspring Characterization and Flip Chip Assembly Reliability.” IMAPSource Proceedings 2009 (Symposium): 492–99. https://doi.org/10.4071/001c.162074.
