Evaluation of a Novel Dielectric Material for Aluminum Substrates

Michael Creamer; Mark Challingsworth; Samson Shahbazi

doi:10.4071/001c.162062

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Creamer, Michael, Mark Challingsworth, and Samson Shahbazi. 2026. “Evaluation of a Novel Dielectric Material for Aluminum Substrates.” IMAPSource Proceedings 2009 (Symposium): 446–51. https://doi.org/10.4071/001c.162062.

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