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ISSN 2380-4505
Symposium Proceedings
Vol. 2009, Issue Symposium, 2009May 07, 2026 EDT

Advanced Lead-Free Server Hardware Reliability Test Methods: Power Age / Power Cycling and Four Point Bend Test Data Results

Matthew Kelly, Timothy Younger, David Braun,
Lead-free Serverhigh complexityhigh reliabilityPower Age Power Cycle testingfour point bend testingelectronic card assembly and test
https://doi.org/10.4071/001c.161901
IMAPSource Conference Papers
Kelly, Matthew, Timothy Younger, and David Braun. 2026. “Advanced Lead-Free Server Hardware Reliability Test Methods: Power Age / Power Cycling and Four Point Bend Test Data Results.” IMAPSource Proceedings 2009 (Symposium): 324–31. https://doi.org/10.4071/001c.161901.
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