ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009May 06, 2026 EDT
Prognostication For Impending Failure in Leadfree Electronics Subjected to Shock and Vibration Using Resistance Spectroscopy
Prognostication For Impending Failure in Leadfree Electronics Subjected to Shock and Vibration Using Resistance Spectroscopy
Lall, Pradeep, Ryan Lowe, Jeff Suhling, and Kai Goebel. 2026. “Prognostication For Impending Failure in Leadfree Electronics Subjected to Shock and Vibration Using Resistance Spectroscopy.” IMAPSource Proceedings 2009 (Symposium): 195–202. https://doi.org/10.4071/001c.161834.
