Case Study: Bright Tin Whisker Risk in PB-free Connector Applications

James Henzi; CJ Lee; Damon Northrop; Hongtao Ma; Tae-kyu Lee; Bill Reynolds; Mason Hu

doi:10.4071/001c.160909

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Henzi, James, CJ Lee, Damon Northrop, Hongtao Ma, Tae-kyu Lee, Bill Reynolds, and Mason Hu. 2026. “Case Study: Bright Tin Whisker Risk in PB-Free Connector Applications.” IMAPSource Proceedings 2009 (Symposium): 136–41. https://doi.org/10.4071/001c.160909.

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