ISSN 2380-4505
Vol. 2009, Issue Symposium, 2009April 20, 2026 EDT
The Effect of Test Conditions on HAST and THB Reliability Testing of Thermal Interface Material, and the Introduction of an Improved Thermal Interface Material
The Effect of Test Conditions on HAST and THB Reliability Testing of Thermal Interface Material, and the Introduction of an Improved Thermal Interface Material
Delano, Andy, Natalie Merrill, and Richard Xu. 2026. “The Effect of Test Conditions on HAST and THB Reliability Testing of Thermal Interface Material, and the Introduction of an Improved Thermal Interface Material.” IMAPSource Proceedings 2009 (Symposium): 104–11. https://doi.org/10.4071/001c.160903.