Electromigration and Annealing Kinetics of Cu pillar

Myeong-Hyeok Jeong; Jae-Won Kim; Gi-Tae Lim; Byoung-Joon Kim; Kiwook Lee; Jaedong Kim; Young-Chang Joo; Young-Bae Park

doi:10.4071/001c.160354

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Jeong, Myeong-Hyeok, Jae-Won Kim, Gi-Tae Lim, Byoung-Joon Kim, Kiwook Lee, Jaedong Kim, Young-Chang Joo, and Young-Bae Park. 2026. “Electromigration and Annealing Kinetics of Cu Pillar.” IMAPSource Proceedings 2009 (Symposium): 876–81. https://doi.org/10.4071/001c.160354.

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