ISSN 2380-4505
Vol. 2025, Issue HiTEC, CICMT, Power, 2025February 05, 2026 EDT
Temperature, Voltage, and Proximity Limitations in AlScN Non-Volatile Memory Devices for Extreme Environments
Temperature, Voltage, and Proximity Limitations in AlScN Non-Volatile Memory Devices for Extreme Environments
Moore, David, Nicholas Glavin, Josh Kennedy, Dhiren Pradhan, Troy Olsson, and Deep Jariwala. 2026. “Temperature, Voltage, and Proximity Limitations in AlScN Non-Volatile Memory Devices for Extreme Environments.” IMAPSource Proceedings 2025 (HiTEC, CICMT, Power): 318–42. https://doi.org/10.4071/001c.156293.