Complex Permittivity Measurements of Substrates and Thin Films at Millimeter-wave Frequencies

Lucas Enright; Bryan Bosworth; Nick Jungwirth; Florian Bergmann; Geoff Brennecka; Benjamin Jamroz; Nate Orloff

doi:10.4071/001c.156178

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Enright, Lucas, Bryan Bosworth, Nick Jungwirth, Florian Bergmann, Geoff Brennecka, Benjamin Jamroz, and Nate Orloff. 2026. “Complex Permittivity Measurements of Substrates and Thin Films at Millimeter-Wave Frequencies.” IMAPSource Proceedings 2025 (HiTEC, CICMT, Power): 564–80. https://doi.org/10.4071/001c.156178.

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