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ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2025, Issue DPC, 2025December 05, 2025 EDT

Thermo-Mechanical Reliability of Bi-Based Solders for High Temperature Packaging

Kyle Wiegand, Faharia H. Bhuiyan, Huilong Liu, Shubhra Bansal,
Bismuth-based solder alloysthermomechanical behaviorssemiconductors
https://doi.org/10.4071/001c.153881
IMAPSource Conference Papers
Wiegand, Kyle, Faharia H. Bhuiyan, Huilong Liu, and Shubhra Bansal. 2025. “Thermo-Mechanical Reliability of Bi-Based Solders for High Temperature Packaging.” IMAPSource Proceedings 2025 (DPC): 947–75. https:/​/​doi.org/​10.4071/​001c.153881.

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