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ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2025, Issue DPC, 2025December 05, 2025 EDT

Characterization and Metrology Development of a Copper Plating Bath for Hybrid Bonding Interconnect

Mike Pavlov, Artyom Duev, Danni Lin, Eugene Shalyt, Cynthia Wang, William Schultz,
Hybrid BondingCopper BathsPackaging
https://doi.org/10.4071/001c.153868
IMAPSource Conference Papers
Pavlov, Mike, Artyom Duev, Danni Lin, Eugene Shalyt, Cynthia Wang, and William Schultz. 2025. “Characterization and Metrology Development of a Copper Plating Bath for Hybrid Bonding Interconnect.” IMAPSource Proceedings 2025 (DPC): 797–823. https:/​/​doi.org/​10.4071/​001c.153868.

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