Complex Permittivity Measurements of Substrates and Thin Films at Millimeter-Wave Frequencies

Lucas Enright; Bryan Bosworth; Nick Jungwirth; Florian Bergmann; Geoff Brennecka; Benjamin Jamroz; Nate Orloff

doi:10.4071/001c.147803

Enright, Lucas, Bryan Bosworth, Nick Jungwirth, Florian Bergmann, Geoff Brennecka, Benjamin Jamroz, and Nate Orloff. 2025. “Complex Permittivity Measurements of Substrates and Thin Films at Millimeter-Wave Frequencies.” IMAPSource Proceedings 2025 (DPC): 1496–1511. https://doi.org/10.4071/001c.147803.

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