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ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2025, Issue DPC, 2025November 19, 2025 EDT

Advanced Packaging Innovations for AI and HPC Enhancing Performance with SiCN for Hybrid Bonding and SiN or SiON for Wafer Flatness Optimization

Mohamed ElGhazzali, Markus Frei, Roland Rettenmeier, Kenton Read, Ewald Strolz, Riccardo Morciano, Patrick Carazzetti,
dielectric layersadvanced packagingvapor deposition
https://doi.org/10.4071/001c.147791
IMAPSource Conference Papers
ElGhazzali, Mohamed, Markus Frei, Roland Rettenmeier, Kenton Read, Ewald Strolz, Riccardo Morciano, and Patrick Carazzetti. 2025. “Advanced Packaging Innovations for AI and HPC Enhancing Performance with SiCN for Hybrid Bonding and SiN or SiON for Wafer Flatness Optimization.” IMAPSource Proceedings 2025 (DPC): 1384–98. https:/​/​doi.org/​10.4071/​001c.147791.

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