ISSN 2380-4505
Vol. 2025, Issue Symposium, 2025November 10, 2025 EDT
Multiphysics Approach to Reliability Prediction of Integrated Circuits Due to Radiation Induced Failures
Multiphysics Approach to Reliability Prediction of Integrated Circuits Due to Radiation Induced Failures
Rostami-Angas, Masoud, Ashok Alagappan, Jiri Drozda, and Sreekanth Gondipalle. 2025. “Multiphysics Approach to Reliability Prediction of Integrated Circuits Due to Radiation Induced Failures.” IMAPSource Proceedings 2025 (Symposium): 265–68. https://doi.org/10.4071/001c.147218.