ISSN 2380-4505
Vol. 2025, Issue Symposium, 2025November 10, 2025 EDT
Facilitating High-Reliability Cu-to-Cu Direct Bonding via Tunable Cu-selective Oxide suppression Coating for Advanced Interconnects
Facilitating High-Reliability Cu-to-Cu Direct Bonding via Tunable Cu-selective Oxide suppression Coating for Advanced Interconnects
Durai, Kevin Antony Jesu, Dinesh Kumar Kumaravel, Khanh Tuyet Anh Tran, Duwage Anushka Sandaruwan Perera, Hsing-Chien Chien, Po-Wen Chiu, Kuei-Hsien Chen, and Oliver Chyan. 2025. “Facilitating High-Reliability Cu-to-Cu Direct Bonding via Tunable Cu-Selective Oxide Suppression Coating for Advanced Interconnects.” IMAPSource Proceedings 2025 (Symposium): 202–8. https://doi.org/10.4071/001c.147199.
